By Peter W. Hawkes (Ed.)

Show description

Read Online or Download Advances in Electronics and Electron Physics, Vol. 70 PDF

Similar electronics books

Tab Electronics Guide to Understanding Electricity and Electronics

During this thorough hobbyist's consultant, electric engineer Slone presents a legitimate evaluate of the fundamental theoretical innovations essential to effectively construct, continue, or fix electronics. additionally, he addresses useful functions akin to tips to construct a workbench, tips on how to solder, and the way to create a elements and fabrics stock via salvaging.

Nonlinear Superconductive Electronics and Josephson Devices

The on-going advancements, and the new achievements of the superconducting electronics (especially within the box of Josephson junctions and the inherent nonlinear dynamics) encouraged us to prepare a convention the place varied teams engaged on the topic may perhaps meet and speak about the most recent result of their investigations.

Encyclopedia of Electronic Components Volume 2: LEDs, LCDs, Audio, Thyristors, Digital Logic, and Amplification

Need to know easy methods to use an digital part? This moment booklet of a three-volume set comprises key details on electronics elements on your projects--complete with images, schematics, and diagrams. you will research what each does, the way it works, why it really is invaluable, and what editions exist. regardless of how a lot you recognize approximately electronics, you will discover interesting info you will have by no means come upon prior to.

Additional resources for Advances in Electronics and Electron Physics, Vol. 70

Sample text

HUEBENER the dependence upon the x-coordinate. The results obtained can easily be extended to a two-dimensional geometry. In Eq. (27) 6y is the length of the junction element perturbed by the beam, and w is the junction width measured along the x-direction. From Eq. (27) we see that the change 61:(yo) is proportional to the current distribution in the unperturbed junction biased at its critical current value. According to Eq. (22) this current distribution is determined by the phase-difference functions 4(yo).

ARRAYS OF SUPERCONDUCTING TUNNEL JUNCTIONS In addition to the studies of single tunnel junctions we have discussed in Sections V and VI, large junction arrays and complex superconducting electronic circuits can be investigated by LTSEM. Such arrays become increasingly interesting because of their fundamental properties (Bindslev Hansen and Lindelof, 1984; Lobb, 1984) and because of their cryoelectronic applications including high-frequency devices (Bindslev Hansen, Finnegan and Lindelof, 198 1 ) or frequency-based voltage standards (Niemeyer, Hinken and Kautz, 1984; Niemeyer, Hinken and Meier, 1984).

Both Figs. 33 and 34 indicate satisfactory agreement between experiment and theory. , 1985. In summary, we have seen that the beam-induced voltage signal 6 V ( x ,y) clearly images the boundaries of a hotspot in a thin-film superconductor. Theoretically the origin of the voltage signal is well understood, and good agreement is found between experiment and theory, including the effects due to high-frequency beam modulation. Noting that the development of a hotspot represents the final stage (before destructive burnout) in the resistive behavior of a thin-film superconductor reached at relatively high values of the applied electric current, the possible role of LTSEM imaging of the “early” stage remains an open and interesting question.

Download PDF sample

Download Advances in Electronics and Electron Physics, Vol. 70 by Peter W. Hawkes (Ed.) PDF
Rated 4.77 of 5 – based on 49 votes